![]() Humphreys FJ (2001) Review grain and subgrain characterisation by electron backscatter diffraction. Humphreys FJ (1999) Quantitative metallography by electron backscattered diffraction. Hirth G, Tullis J (1992) Dislocation creep regimes in quartz aggregates. Herter T, Lott K (1993) Algorithms for decomposing 3-D orthogonal matrices into primitive rotations. Heinz A, Neumann P (1991) Representation of orientation and disorientation data for cubic, hexagonal, tetragonal and orthorhombic crystals. Halfpenny A, Prior DJ, Wheeler J (2012) Electron backscatter diffraction analysis to determine the mechanisms that operated during dynamic recrystallisation of quartz-rich rocks. Gidla MR (2017) Effect of machining on mechanical, tribological and functional properties of mild steel, M.Tech. Ghosh JG, de Wit MJ, Zartman RE (2004) Age and tectonic evolution of Neoproterozoic ductile shear zones in the Southern Granulite Terrain of India, with implications for Gondwana studies. Gertsman VY, Tangri K (1995) Computer simulation study of grain boundary and triple junction distributions in microstructures formed by multiple twinning. Gertsman VY, Janecek M, Tangri K (1996) Grain boundary ensembles in polycrystals. Gertsman V (2001) Coincidence site lattice theory of multicrystalline ensembles. Microsc Microanal 11(S02):528–529Įl-Dasher BS, Adams BL, Rollett AD (2003) Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals. Philos Mag: J Theor Exp Appl Phys 16(144):1179–1184ĭingley DJ, Wright SI, Nowell MM (2005) Dynamic background correction of electron backscatter diffraction patterns. Electrochimica Acta 46(24):3867–3877Ĭoates DG (1967) Kikuchi-like reflection patterns obtained with the scanning electron microscope. Čı́hal Vr, Štefec R (2001) On the development of the electrochemical potentiokinetic method. ElsevierĬhen D, Kuo J-C, Wu W-T (2011) Effect of microscopic parameters on EBSD spatial resolution. J Appl Phys 39(12):5503–5514īunge HJ (2013) Texture analysis in materials science: mathematical methods. Mater Sci Technol 22(11):1279–1286īunge HJ, Haessner F (1968) Three-dimensional orientation distribution function of crystals in cold-rolled copper. Acta Metall 29(10):1703–1719īrough I, Bate PS, Humphreys FJ (2006) Optimising the angular resolution of EBSD. Acta Metall 14(11):1479–1484īrokman A, Balluffi RW (1981) Coincidence lattice model for the structure and energy of grain boundaries. Scanning 21(3):187–190īrandon D (1966) The structure of high-angle grain boundaries. Cent Aust Tectonophysics 32(3):235–267īerger D, Niedrig H (1999) Complete angular distribution of electrons backscattered from tilted multicomponent specimens. J Microsc 220(1):36–46īell TH, Etheridge MA (1976) The deformation and recrystallization of quartz in a mylonite zone. Int J Sci Eng Res 3(4):1–6īate PS, Knutsen RD, Brough I, Humphreys FJ (2005) The characterization of low-angle boundaries by EBSD. Philos Mag Lett 76(4):237–246Īl-Samarai RA, Haftirman KRA, Al-Douri Y (2012) The influence of roughness on the wear and friction coefficient under dry and lubricated sliding. Acta Mater 60(1):376–386Īhmed J, Wilkinson AJ, Roberts SG (1997) Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI). This paper will give a brief glimpse of the capability of this, now ubiquitous, technique for microstructural and textural characterization of materials.Ībolghasem S, Basu S, Shekhar S, Cai J, Shankar M (2012) Mapping subgrain sizes resulting from severe simple shear deformation. Orientation data has also enabled researchers to extract micro-textural information about the material, which includes, but not limited to, pole figures and orientation distribution function (ODF). Orientation information also allows one to extract misorientation data, which in turn provides details about various types of grain and phase boundaries in the material. With the orientation data, one can easily obtain quantitative information about grain size, morphology, and phase fractions. First and foremost, orientation information allows one to ascertain the presence and spatial distribution of various phases in a material. In principle, EBSD technique gathers only the crystal orientation data of each and every scanned point however, this orientation data contains significant information in itself and it has become a transformative technique for the characterization of crystallographic materials. With the advent of SEM-based techniques like energy-dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), extensive quantitative characterization of the microstructure of a material has also become possible. Scanning electron microscopy (SEM) has always been an essential tool for the qualitative analysis of microstructure of any material. ![]()
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